The 4145B Semiconductor Parameter Analyzer is a stand-alone instrument capable of complete dc characterization of semiconductor devices and materials. It stimulates voltage and current sensitive devices, measures the resulting current and voltage response, and displays the results in a user-selectable format (graph, list, matrix or schmoo i.e.source monitoring) on a built-in CRT display.
Fully automatic, high-speed dc characterization of semiconductor devices
High resolution, wide range sourcing and measurement. I: 1pA - 100mA, V: 1mV - 100V
Maximum 1150 measurement and display points for precise measurement and analysis
Flexible graphic analysis functions for quick parameter extraction
Built-in micro flexible disc drive for storage of 240 user programs or 105 measurement results